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Spectroscopy

This laboratory facilitates advanced spectroscopic analysis for investigating molecular structure, chemical composition, and optical properties of materials. It supports a wide range of studies including functional group identification, elemental and compound detection, and absorbance/reflection behavior, essential for research in nanomaterials, polymers, semiconductors, catalysts, and other functional materials.

Spectroscopy Instruments

Gas Chromatography–Mass Spectrometry (GCMS) with stratum water analyzer

GCMS-QP2010 PLUS, Toshvin Analytical

Description:

GCMS is a powerful analytical technique offers a wide temperature range from 4°C to 450°C, enabling the analysis of a broad spectrum of substances. The system features an advanced flow controller for accurate and stable carrier gas management, ensuring reproducible results.

Spectroscopy Instruments

Fourier Transform InfraRed (FT-IR) Spectrometer

IRTracer-100, SHIMADZU IRTRACER 100

Description:

A Fourier Transform Infrared (FT-IR) Spectrometer is an instrument which acquires broadband Near Infrared (NIR) to Far Infrared (FIR) spectra, high resolution of 0.25 cm⁻¹, and rapid scanning capabilities of up to 20 spectra per second.

Spectroscopy Instruments

UV-VIS-NIR Spectrophotometer

SHIMADZU UV 5600 PLUS

Description:

UV-Visible spectroscopy is a widely used simple and non-destructive technique, enabling detailed analysis in the ultraviolet, visible, and near-infrared regions. This extensive range makes it suitable for a wide array of applications, including material science, pharmaceuticals, and environmental monitoring.

Spectroscopy Instruments

XPS (X-Ray Photoelectron Spectroscopy)

VersaProbe III, ULVAC PHI (Physical Electronics)

Description:

X-ray Photoelectron Spectroscopy (XPS) is a surface-sensitive technique that analyzes elemental composition, chemical states, and electronic structure within the top ~10 nm. It is widely used for characterizing thin films, semiconductors, and various inorganic and organic materials.

Spectroscopy Instruments

UV-Vis Spectrophotometer with DRS System

V-750, JASCO-JAPAN

Description:

Its optical design uses precision double-beam optics with variable spectral bandwidth. A high sensitivity PMT detector provides accurate and reproducible measurements for low to high concentration samples. By controlling the high voltage applied to the PMT, the dynode feedback offers a wider dynamic range than generally found on UV-Visible spectrophotometers.

Spectroscopy Instruments

Spectrofluorometer

FP-8350, JASCO-JAPAN

Description:

It is an extremely sensitive spectrofluorometer that can be used in the broadest range of applications. Many features like automatic cut-off filters eliminate peaks due to second-order scatter, giving more confidence in artifact-free spectral measurement.

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