The X-ray Diffraction (XRD) spectrometer analyzes the crystallographic properties of solids, liquids, and powders. It provides detailed information on atomic arrangement, crystal structure, phase composition, and lattice features within materials.

Single crystal X-ray diffraction system provides high-precision analysis of atomic and molecular structures in crystalline materials. It delivers detailed insights into atomic arrangements, lattice positions, and interatomic distances, offering exceptional resolution for complex crystal structures.

Atomic Force Microscopy (AFM) is a high-resolution technique that uses a sharp probe to scan material surfaces at the nanoscale, producing detailed topographical images. It is non-destructive, adaptable, and ideal for analyzing various materials, offering real-time imaging and quantitative data on surface forces and interactions.

Field Emission Scanning Electron Microscopy (FESEM) is an advanced imaging technique that provides high-resolution surface topography and elemental analysis at magnifications from 10x to 300,000x. It offers sharper images with minimal distortion and a spatial resolution of 1.5 nm, significantly outperforming conventional SEM.